MEMORY_TEST Project Status
Project File: Memory_test.ise Current State: Programming File Generated
Module Name: Block_Ram_Test
  • Errors:
No Errors
Target Device: xc2s100-5tq144
  • Warnings:
16 Warnings
Product Version: ISE, 8.1i
  • Updated:
Thu Feb 16 10:51:30 2006
 
Device Utilization Summary
Logic UtilizationUsedAvailableUtilizationNote(s)
Number of Slice Flip Flops 38 2,400 1%  
Number of 4 input LUTs 12 2,400 1%  
Logic Distribution    
Number of occupied Slices 26 1,200 2%  
Number of Slices containing only related logic 26 26 100%  
Number of Slices containing unrelated logic 0 26 0%  
Total Number 4 input LUTs 48 2,400 2%  
Number used as logic 12      
Number used as a route-thru 36      
Number of bonded IOBs 7 92 7%  
Number of Block RAMs 1 10 10%  
Number of GCLKs 1 4 25%  
Number of GCLKIOBs 1 4 25%  
Total equivalent gate count for design 16,976      
Additional JTAG gate count for IOBs 384      
 
Performance Summary
Final Timing Score: 0 Pinout Data: Pinout Report
Routing Results: All Signals Completely Routed Clock Data: Clock Report
Timing Constraints: All Constraints Met    
 
Detailed Reports
Report NameStatusGenerated ErrorsWarningsInfos
Synthesis ReportCurrentThu Feb 16 10:51:10 2006016 Warnings0
Translation ReportCurrentThu Feb 16 10:51:14 2006000
Map ReportCurrentThu Feb 16 10:51:17 2006002 Infos
Place and Route ReportCurrentThu Feb 16 10:51:22 2006002 Infos
Static Timing ReportCurrentThu Feb 16 10:51:24 2006002 Infos
Bitgen ReportCurrentThu Feb 16 10:51:30 2006000