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READ THE MICROWAVE CONNECTOR CARE MANUAL BEFORE OPERATING THIS EQUIPMENT! Manual located on shelves in 244.
Semiconductor
Testing
TDR Characterization
of Circuit Boards, IC Packages and Cables
CSA
803 and 11801A Programer Reference
CSA
803 and 11801A Command Reference
SD-14:
2.5 GHz high impedance (100 kilohms/0.475pF) dual-channel probe sampler
SD-24:
20 GHz dual-channel TDR/sampling head
SD-26:
20 GHz dual-channel sampling head
SIU
800: Static Isolation Unit
The instrument is
located in room 241
All manuals are on
the shelves in 244 and should be returned there
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procedure for capturing screen images as bitmap files. Click here to
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This is a front-panel reference manual for the 11801A Digital Sampling Oscilloscope. If you are a new user, first read the 11801A Digital Sampling Oscilloscope Tutorial to become familiar with the 11801A. Use this manual as a reference to answer specific questions about 11801A operation.
The first section of this manual, At a Glance, presents a quick get-acquainted information and a map of the menu system. Each menu is accompanied by pointers into the detailed second section, In Detail.
Read this manual to familiarize yourself with the 11801A and to learn about its capabilities. There are examples in this manual that will help you learn how to use the 11801A.
The first section presents operator information about physically installing the 11801A, installing sampling heads and connecting cables to it. Examine this information carefully, it contain important safety information. In particular, the discussion about the SMA-compatible connectors is critical to accurate operation of the 11801A. The remainder of this manual presents a series of examples that will help you quickly learn the capabilities of the 11801A.
This document, along with the CSA 803 and 11801A Command Reference, provides a comprehensive, easily accessible information to aid you in operating your instrument e General Purpose Interface Bus or the RS-232-C interface.
This manual contains complete descriptions of the commands available via the GPIB and RS-232-C interfaces for the CSA 803 Communications Signal Analyzer and the 11801A Digital Sampling Oscilloscope. Use this manual with the CSA 803 and 11801A Programmer Reference, which contains programmer tutorial and reference material, and with the User Reference for your instrument
This manual is designed for use by qualified service personnel. It contains information necessary to check, troubleshoot, and maintain the11801A.
Troubleshooting is primarily based upon internal power-on diagnostics. These diagnostics isolate the problems to the field replaceable unit (FRU) level. Defective FRUs not detected by diagnostics are isolated using other means. Once the faulty FRu is identified, use the instructions provided in this manual to remove and replace it. The removal and the immediate replacement of the faulty FRU allows a minimum downtime for the user. Section 5, Replaceable Parts, gives a complete list of FRUs in this instrument.
This section gives safety information and information about installing and removing a sampling head, applying power, proper environmental conditions, shipping the instrument, and instrument options.
The SD-14 Sampling Head is a high-performance, probe-equipped sampling head that can be installed in the 11800 Series Digital Sampling Oscilloscopes, the SM-11 Multi-Channel Unit, and the CSA 803 Series Communications Signal Analyzers.
The instrument mainframe in which the SD-14 is installed must have a firmware compatible with the SD-14. An 11801B or CSA 803A must have Executive Processor and Time Base/Controller firmware version 4.00 or above. An 11801 or 11802 Oscilloscopes must have Executive Processor and Time Base/Controller firmware version 10.00 or above.
The SD-14 Sampling Head provides the following features:
The strobe drive signal from the instrument controls the timing of the strobe assertion to each acquisition system. A variable delay adjustment on channel 2 guarantees sampling coincidence between the two channels or allows intentional skewing between channels.
The strobe sense signal is a part of the strobe signal returned to the instrument. For calibration purposes, the instrument monitors the time duration of the strobe drive/strobe sense loop and adjusts delay inside the instrument to maintain correct strobe timing.
A User Manual and a Service Manual are available for this sampling head.
Applying a voltage outside the range ± 3 V can result in damage to the sampling head or instrument. Use a wrist strap to prevent electrostatic damage to the sampling head or instrument.
The SD-24 TDR/Sampling Head is a high-performance sampling head that can be installed in the 11800 series of the Digital Sampling Oscilloscopes and in the Sm-11 Multi-Channel Unit.
The SD-24 TDR/Sampling Head provides the following feature:
The strobe drive signal from the mainframe controls the timing of the strobe assertion to each acquisition system. The strobe generator is the sampling head is common to both channels, guaranteeing sampling coincidence between the two channels.
The strobe sense signal is a part of the strobe signal returned to the mainframe. The mainframe monitors the time duration of the strobe drive/strobe sense loop and adjusts a delay line (inside the mainframe) to maintain correct strobe timing.
Both channels have a step generator. The step generators can assert a negative-going or positive-going step independently. Using both channels, you can perform differential and common mode Time Domain Reflectometry (TDR) and two-port, time domain network analysis.
The acquisition rise time is 17.5 ps or less. The displayed TDR reflected rise time is 35 ps or less. To ensure proper timing between the two step outputs, the second channel is equipped with a variable delay.
A User Manual and a Service Manual are available for this sampling head.
Applying a voltage outside the range ±3 V can result in damage to the sampling head or instrument. Use a wrist strap to prevent electrostatic damage to the sampling head or instrument.
The SD-26 Sampling Heads are high-performance sampling heads that can be installed in the 11800 Series Digital Oscilloscopes, the SM-11 Multi-Channel Unit, and the CSA 803 Series Communications Signal Analyzers.
The SD-26 Sapling Heads provide the following features:
The strobe drive signal from the instrument controls the timing of the strobe assertion to each acquisition system, and guarantees sampling coincidence between the two channels.
the strobe sense signal is a part of the strobe signal returned to the instrument. The instrument monitors the time duration of the strobe drive/strobe sense loop and adjusts a delay inside the instrument to maintain correct strobe timing.
A User Manual and a Service Manual are available for this sampling head.
The Static Isolation Unit (SIU) is a two-channel device that protects sensitive sampling head input circuitry from harmful static discharge.
The SIU is installed between the DUT (Device Under Test) and the sampling head and is controlled by a foot switch. When the foot switch is in the normal position (not pressed), the DUT is grounded through a 50 ohm termination resistor. This will discharge any static stored in the DUT. Pressing the foot switch connects the DUT to the sampling head input allowing a measurement to be made. Both channels switch simultaneously when the switch is pressed.
The SIU will not protect the sampling head input from static discharge while the foot switch is depressed. Example: If you want to touch a transmission line on a circuit board to identify the location of a discontinuity, you must be grounded through a wrist strap of similar device.
To use the SIU, you will need two 50 ohm coaxial cables with SMA compatible connectors. In addition to your normal DUT cables or probes, we recommend you use Tektronix part number 015-0560-00. The quality of the coaxial cables is important for the meeting of performance specifications. you also need two 50 ohm terminations (Tektronix part number 015-1022-00) which are supplied with the SIU.
Power is supplied to the SIU using a 12 V DC power supply (Tektronix part number 119-1748-xx).
The SIU contains the following components and assemblies:
An Instruction Manual is available for this accessory
The IPA 510 Interconnect Parameter Analyzer system measures high-speed interconnects, extracts models, and verifies the models by overlaying simulated and actual results. The IPA 510 system is composed of precision hardware components, described below, plus standard and optional IPA 510 software. The system provides unique waveform processing, model extraction, and simulation capability.
The standard IPA 510 package includes:
The Nexus High Speed test Fixture provides a precision interface between the device under test (DUT) and the sampling oscilloscope. The coaxial coupling begins at the lead of your DUT and continues with minimal aberrations to the sampling head SMA connector.
The Nexus supports two families of IC packages:
| Input Sources | |
| Mainframe | 4 sampling heads, 8 channels |
| Option 01, with 4 SM-11 Multi-Channel Units | 68 sampling heads, 136 channels |
| Bandwidth | dependent on sampling head |
| Rise time | dependent on sampling head |
| Amplifier gain accuracy | ± 1% of full-scale range |
| Vertical resolution | |
| Trace data | 8 bits |
| Hardware measurements | 14 bits |
| Input sensitivity | 2 mV/div to 255 mV/div in 1 mV/div steps |
| Offset accuracy | ± 2 mV |
| Offset range | ± 2 V |
| Offset resolution | 0.25 mV |
| Measurement level accuracy | ± 1 mV |
| Vertical acquisition display resolution | |
| Single graticule | 25 points/div |
| Dual graticule | 25 points/div |
| Vertical display resolution | |
| Single graticule | 50 pixels/div |
| Dual graticule | 25 pixels/div |
| Internal Reference Clock | Crystal-controlled oscillator, voltage controlled oscillator for timebase |
| Sample rate | 200 KHz maximum |
| Record length | User selectable, 512, 1024, 2048, 4096, or 5120 points. |
| Sweep rate resolution | 1-2-5 steps or 1 ps/div increments |
| Record duration | 10 ps to 50 ms |
| Maximum sweep rate | |
| 512-point record | 1 ps/div |
| 1024-point record | 1ps/div |
| 2048-point record | 2 ps/div |
| 4096-point record | 5 ps/div |
| 5120-point record | 5 ps/div |
| Time interval measurement accuracy | 10 ps or ± 0.01% of selected delay |
| Touch panel | Infrared beam touchable array, 22 rows of 11 columns |
| Knobs | 2 general-purpose knobs, set by user desired function |
| Calibrator output pulse | |
| Voltage | 500 mV open circuit or 250 mV into 50 ohms |
| Frequency | Approximately 100 kHz (50 kHz if divide-by-two mode selected) |
| Rise time | Approximately 250 ps into 50 ohm |
| Internal clock output | Synchronized with the TDR and calibrator output |
| Voltage | Positive pulse from 0 to 2.0 V |
| Impedance | from 50 ohm |
| Repetition rate | Approximately 100 kHz (50 kHz if divide-by-two mode is selected) |
| Trigger source | External trigger or internally generated clock signal |
| Trigger mode | |
| Auto | Free runs after 50 ms timeout |
| Normal | Acquisition only after trigger event |
| Maximum trigger input | 5 V DC or 5 V rms |
| External trigger attenuation | X1 and X10 |
| Trigger level | -1 V to +1 V, X1 attenuation
-10 V to +10 V, X10 attenuation |
| Trigger level resolution | 10 mV, X1 attenuation |
| Trigger accuracy | 10% of full scale |
| Trigger sensitivity | |
| DC coupled | 40 mV peak-peak from DC to 200 MHz, increasing to 150 mV peak-peak at 800 MHz, increasing to 250 mV at 2.o GHz |
| AC coupled | 40 mV peak-peak from 30 kHz to 200 MHz, increasing to 150 mV peak-peak at 2.0 GHz Attenuates signals below 30 kHz |
| Main and window position | Minimum 40 ns pre-trigger required |
| Initial window delay | 40 ns to 50 ms in 1-ps steps |
| Strobe skew adjustment | ±1 ns |
| CRT | 8 1/2 inch diagonal, color, magnetic deflection. Vertical raster orientation. Nominal screen size: 6.087 inches vertical by 4.496 inches horizontal |
| Character display | 44 lines of 55 characters |
| Character height | 0.10 in (upper case) |
| Character cell | 16 pixel vertical by 10 pixel horizontal |
| Voltage ranges | 90 to 132 V rms or 180 to 250 V rms Voltage ranges apply to trace distortion, which reduces peak line voltage by 5% |
| Frequency | 48 Hz to 440 Hz |
| Power | 320 W |
| Current | 4.6 A rms at 50 Hz, 90 V line with 5% clipping |
| Fuse | 6A, 250 V normal blow |
| Temperature | Meets MIL-T-28800D, Type |||, Class 5, tested per paragraphs 4.5.5.1.3 and 4.5.5.1.4 |
| Operating | 0 to 50 degrees Celsius |
| Non-operating | -40 to 75 degrees Celsius |
| Humidity | Up to 95% relative humidity, at up to 50 degrees Celsius |
| Altitude | Meets MIL-T-28800D, Type |||, Class 5 |
| Operating | Up to 4.5 km (15,000 ft) |
| Non-operating | Up to 15 km (50, 000 ft) |
| Vibration | Operating, sampling heads not installed: meets MIL-T-2800D, Type |||, Class 5, section 4.5.5.3.1 |
| Shock | Non-operating, sampling heads not installed: meets MIL-T-2800D, Type |||, Class 5, section 4.5.5.3.1 |
| Bench handling | Operating: meets MIL=T-2800D, Type |||, Class 5, section 4.5.5.3 |
| Packaged product vibration and bounce | Packaged product, sampling heads not installed, meets ASTM D999-75, Method A, para 3.1 (NSTA Proj. 1A-B-2) |
| Drop of packaged product | Packaged product, sampling heads not installed: meets ASTM D775-61 Method 1, para 5 (NSTA Proj. 1A-B-2) |
| Electrostatic immunity | No disruption or degradation of performance: up to 15 kV. No damage to instrument: up to 20 kV |
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Send questions or comments to mahaney@cs.unc.edu
This Page was created by Jim Mahaney and last updated on August 14, 1997